Welcome
Forvis Technologies Inc. specializes in providing custom designed cutting edge analytical solutions for small and wide angle x-ray scattering (SAXS/WAXS), single crystal and thin film diffractometry, and powder diffraction for characterizing the nanoscale structure of materials in the range spanning 0.1 nm-1000 nm.

We offer a wide range of services including complete turn-key systems, highly customized designs based on specific end-user requirements, system integration services, x-ray detectors, environmental sample chambers, and x-ray optical components.
Forvis Technologies Inc. has delivered innovative solutions to researchers worldwide engaged
in advanced studies of biological, polymeric, electronic and
nanostructured materials.
Our customer list includes many leading universities and industrial
research laboratories in the US and Canada, Europe and Asia.
Expert advice on x-ray diffraction solutions to solve challenging problems in nanoscience and technology |
Customized design services and products to meet the needs of cutting edge x-ray structural characterization |
Full scale system integration to deliver latest technological advances and capabilities |
For more information, please contact:
Email: info@forvistech.com
Phone: (805) 618-1746
Fax: (805) 456-4499
3463 State Street, Suite 262
Santa Barbara, CA 93105
USA