Forvis Technologies, Inc. specializes in providing custom designed cutting edge analytical solutions for small and wide angle x-ray scattering (SAXS/WAXS), single crystal and thin film diffractometry, and powder diffraction for characterizing the nanoscale structure of materials in the range spanning 0.1 nm-1000 nm.

We offer a wide range of services including complete turn-key systems, highly customized designs based on specific end-user requirements, system integration services, x-ray detectors, environmental sample chambers, and x-ray optical components.

Forvis has delivered innovative solutions to researchers worldwide engaged in advanced studies of biological, polymeric, electronic and nanostructured materials. Our customer list includes many leading universities and industrial research laboratories in the US and Canada, Europe and Asia.

CONSULTING Expert advice on x-ray diffraction solutions to solve challenging problems in nanoscience and technology

DESIGN Customized design services and products to meet the needs of cutting edge x-ray structural characterization

INTEGRATION Full scale system integration to deliver latest technological advances and capabilities