The system can be built with sealed-tube or rotating anode x-ray sources, Gobel mirror monochromator, Huber four-circle goniometer, low noise scintillation detector and a area detector (for example Pilatus or Eiger series from Dectris). The integrated instrument can be configured for single crystal diffraction/crystallography, x-ray reflectivity and thin film diffraction, or high speed in-situ powder diffraction. Applications include studies of electronic and magnetic materials, thin film metrology (thickness and rough powerness, rocking curve), material and phase identification, texture (pole figure) measurements, and x-ray crystallography.